| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Semiconductor integrated circuits—Analog digital（AD） converter
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Published |
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На языке оригинала
|
2318,00
|
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Semiconductor intergrated circuits—Test method of direct digital frequency synthesizer
|
Published |
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На языке оригинала
|
2520,00
|
|
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Micro-electromechanical systems（MEMS）technology—Bending strength test method for microstructures of silicon based MEMS
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Published |
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На языке оригинала
|
1310,00
|
|
|
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Micro-electromechanical systems（MEMS） technology—Impact test method for nanostructures of silicon based MEMS
|
Published |
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На языке оригинала
|
1310,00
|
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Micro-electromechanical systems（MEMS） technology—Tensile strength test method for nano-scale membranes of silicon based MEMS
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Published |
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На языке оригинала
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1310,00
|
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|
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Integrated circuits—Measurement of electromagnetic immunity—Part 1: General conditions and definitions
|
Published |
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На языке оригинала
|
1814,00
|
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Integrated circuits—Measurement of electromagnetic immunity—Part 8: Measurement of radiated immunity—IC stripline method
|
Published |
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На языке оригинала
|
2066,00
|
|
|
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Displacement damage test method for components
|
Published |
|
На языке оригинала
|
1210,00
|
|
|
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Semiconductor integrated circuits—Measuring methods of video encoder and decoder circuits
|
Published |
|
На языке оригинала
|
2318,00
|
|
|
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Microwave circuits—Test methods for detector
|
Published |
|
На языке оригинала
|
1814,00
|
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Semiconductor integrated circuits—Digital-analog（DA）converter
|
Published |
|
На языке оригинала
|
2520,00
|
|
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Semiconductor integrated circuits—Flash memory(FLASH)
|
Published |
|
На языке оригинала
|
1562,00
|
|
|
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Semiconductor integrated circuits—Test method of driver device
|
Published |
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На языке оригинала
|
2066,00
|
|
|
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Nanotechnology—Nano-enabled optoelectrical display— Measurement of optical performance for quantum dot enabled light conversion film
|
Published |
|
На языке оригинала
|
2066,00
|
|
|
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Nanotechnology—Nano-enabled optoelectrical display—Optical reliability assessment for quantum dot enabled light conversion film
|
Published |
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На языке оригинала
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1310,00
|
|
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Workmanship requirements for rework, modification and repair of soldered electronic assemblies
|
Published |
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На языке оригинала
|
2318,00
|
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Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
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Published |
|
На языке оригинала
|
1562,00
|
|
|
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Measurement techniques of piezoelectric,dielectric and electrostatic oscillators—Part 2: Phase jitter measurement method
|
Published |
|
На языке оригинала
|
1814,00
|
|
|
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Measuring methods of converter modules for high voltage input power supplies
|
Published |
|
На языке оригинала
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3629,00
|
|
|
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Integrated circuits—Measurement of impulse immunity—Part 3: Non-synchronous transient injection method
|
Published |
|
На языке оригинала
|
2318,00
|
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